Device Testing with Digital Pattern Instruments
The Device Testing with Digital Pattern Instruments course enables Test and Validation Engineers to perform characterization and production test of semiconductor devices with digital pattern instruments. The course will focus on how digital pattern instruments and the Digital Pattern Editor can be leveraged to perform common device tests, with a focus on DUT communication, digital interface testing, and continuity and leakage testing. The course will guide the learner through the complete test workflow, from calibration and debugging to extending tests into a test executive.
Duration
- 20 lessons | 5 hours
Audience
- Test Engineers performing semiconductor device characterization and production test.
Course Objectives
Create and edit all elements required to burst a digital pattern to your DUT, including pin maps, level sheets, timing sheets, and pattern files
- Test DUT modes of operation with SPI commands
- Validate DUT communication via register readback testing
- Validate DUT timing by interfacing with external test equipment
- Validate DUT pin connections via continuity and leakage testing
- Utilize opcodes to establish flow control within patterns
- Use source and capture waveforms to simplify pattern structure and store data
- Synchronize your digital pattern instrument with other instruments in your systems
- Use History RAM reports, Shmoo plots, and digital scope to perform debugging activities
- Calibrate your instruments and correct for any cable skew
- Import a pattern into a test executive
Prerequisites
LabVIEW or .NET programming experience.
Hardware and Software
NI Online Training courses are best utilized on systems meeting minimum requirements for best performance. Use the following guidelines:
Software
- NI Digital Pattern Editor 2023 Q4, or later
- NI-Digital Pattern Driver 2024 Q4, or later
- LabVIEW 2024 Q1, or later
Hardware
Use simulated hardware where applicable or the list below as reference if you want to program and test the hardware related exercises:
- PXIe-6570
- PXIe-6571
Milestone
-
Lesson List
Creating and Bursting Your First Pattern
Required
Lesson
| Duration: 5 minutesView DetailsConfiguring a pin map, level sheet, timing sheet, and pattern file, bursting a digital pattern to the device under test (DUT).Creating Pin Maps
Required
Lesson
| Duration: 8 minutesView DetailsCreating pin maps in Digital Pattern Editor to define DUT connection sites.Creating Specifications Sheets
Required
Lesson
| Duration: 5 minutesView DetailsStoring values from the data sheet of DUT in specifications sheet variables.Creating Pin Levels Sheets
Required
Lesson
| Duration: 3 minutesView DetailsCreating pin levels sheets to define the supply voltages, termination, and logic levels for the DUT.Creating Timing Sheets
Required
Lesson
| Duration: 11 minutesView DetailsCreating timing sheets to define the timing characteristics of the interface with the DUT.Creating Pattern Files
Required
Lesson
| Duration: 28 minutesView DetailsCreating pattern files to communicate with and test the DUT.Programming Digital Patterns
Required
Lesson
| Duration: 21 minutesView DetailsProgrammatically controlling Digital Pattern Instruments using NI-Digital Pattern API.Testing DUT Modes of Operation
Required
Lesson
| Duration: 16 minutesView DetailsConfiguring the DUT with Serial Peripheral Interface (SPI) commands to test its modes of operations.Performing Register Readback Tests
Required
Lesson
| Duration: 8 minutesView DetailsPerforming a register readback test to validate the communication capabilities of the DUT.Validating DUT Timing
Required
Lesson
| Duration: 5 minutesView DetailsInterface with external test equipment to validate the DUT timing.Performing Continuity and Leakage Testing
Required
Lesson
| Duration: 7 minutesView DetailsPerforming continuity and leakage tests to validate DUT pin connections.Increasing Pattern Robustness with Flow Control
Required
Lesson
| Duration: 18 minutesView DetailsIncreasing the robustness of a pattern by using opcodes to establish flow control.Using Source Waveforms
Required
Lesson
| Duration: 31 minutesView DetailsUsing serial and parallel source waveforms to simplify a pattern structure with variable data.Using Capture Waveforms
Required
Lesson
| Duration: 17 minutesView DetailsUsing capture waveforms to store received data for validation and post-processing.Reviewing Test Results with History RAM Report
Required
Lesson
| Duration: 16 minutesView DetailsUsing the result of the History RAM report to debug pattern or device under test (DUT).Viewing Signals with Digital Scope
Required
Lesson
| Duration: 6 minutesView DetailsUse a digital scope to view the actual voltage levels on the pins of Digital Pattern Instrument (PXIe-657x).Using Shmoo Plots to Visualize Parameter Relationships
Required
Lesson
| Duration: 8 minutesView DetailsUsе Shmoo plots to iterate over pattern parameters and view results.Synchronizing with Other Instruments
Required
Lesson
| Duration: 21 minutesView DetailsImplementing synchronization strategies such as sharing triggers or using NI-TClk to coordinate tasks with other instruments.Wiring and Calibration
Required
Lesson
| Duration: 12 minutesView DetailsCompensate for cable skew and voltage offsets and explore device calibration requirements.Using Opcodes for Scan Testing
Required
Lesson
| Duration: 7 minutesView DetailsUsе the scan opcode to divide a vector into one or more scan cycles.