Binning DUTs Based on Test Results
Explore the different ways that you can categorize DUTs based on the test results and implement a binning strategy.
Audience
- Semiconductor test engineers using or evaluating the NI Semiconductor Test System (STS) to perform semiconductor production test or high-volume automated device validation.
Lesson Objectives
- Overview of Binning
- Setting the Bin Definitions File
- Creating Hardware and Software Bins