Binning DUTs Based on Test Results
Explore the different ways that you can categorize DUTs based on the test results and implement a binning strategy.
Audience
- Semiconductor test engineers using or evaluating the NI Semiconductor Test System (STS) to perform semiconductor production test or high-volume automated device validation.
Lesson Objectives
- Overview of Binning
- Setting the Bin Definitions File
- Creating Hardware and Software Bins
Hardware and Software
NI Online Training courses are best utilized on systems meeting minimum requirements for best performance. Use the following guidelines:
Software
- NI STS Software Bundle v23.0
Hardware
Use simulated hardware where applicable or the list below as reference if you want to program and test the hardware related exercises:
- NI STS T1 M2
- STS T1 DX Training DIB
- ADS7229