Binning DUTs Based on Test Results

Explore the different ways that you can categorize DUTs based on the test results and implement a binning strategy.

Audience

  • Semiconductor test engineers using or evaluating the NI Semiconductor Test System (STS) to perform semiconductor production test or high-volume automated device validation.

Lesson Objectives

  • Overview of Binning
  • Setting the Bin Definitions File
  • Creating Hardware and Software Bins